Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
CrossRef Search
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
You requested this document:
1. Coding Strategies for Multiple-Access Channels With Feedback and Correlated Sources
Ong, L.; Motani, M.;
Information Theory, IEEE Transactions on
Volume 53,  Issue 10,  Oct. 2007 Page(s):3476 - 3497
Abstract:

The multiple-access channel with feedback and correlated sources (MACFCS) models a sensor network in which sensors collect and transmit correlated data to a common sink. We present four achievable rate regions and a capacity outer bound for the MACFCS. For the first achievable region, we construct a decode-forward based coding strategy. The sources first exchange their data, and then cooperate to send full information to the destination. We term this strategy full decoding at sources with decode-forward (FDS-DF). For two of the other achievable regions, we first perform Slepian-Wolf coding to remove the correlation among the source data. This is followed by either (i) a compress-forward based coding strategy for the multiple-access channel with feedback, or (ii) an existing coding strategy for the multiple-access channel. We also find another achievable region using a multihop coding strategy, which only uses point-to-point coding (no cooperation). From numerical computations, we see that different strategies perform better under certain source correlation structures and network topologies. More specifically, FDS-DF approaches the capacity when (i) the inter-source distance decreases, or (ii) the correlation among the sources gets higher. Furthermore, the cooperative coding strategies considered support larger achievable rate regions than the noncooperative multihop strategy.
Abstract | Full Text: PDF(529 KB)    IEEE JNL
 
» Key
IEEE JNL IEEE Journal or Magazine
IEE JNL IEE Journal or Magazine
IEEE CNF IEEE Conference Proceeding
IEE CNF IEE Conference Proceeding
IEEE STD IEEE Standard
 
 
Indexed by IEE Inspec
© Copyright 2008 IEEE – All Rights Reserved