Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
CrossRef Search
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
You requested this document:
1. Unsupervised multistage image classification using hierarchical clustering with a bayesian similarity measure
Sanghoon Lee; Crawford, M.M.;
Image Processing, IEEE Transactions on
Volume 14,  Issue 3,  March 2005 Page(s):312 - 320
Abstract:

A new multistage method using hierarchical clustering for unsupervised image classification is presented. In the first phase, the multistage method performs segmentation using a hierarchical clustering procedure which confines merging to spatially adjacent clusters and generates an image partition such that no union of any neighboring segments has homogeneous intensity values. In the second phase, the segments resulting from the first stage are classified into a small number of distinct states by a sequential merging operation. The region-merging procedure in the first phase makes use of spatial contextual information by characterizing the geophysical connectedness of a digital image structure with a Markov random field, while the second phase employs a context-free similarity measure in the clustering process. The segmentation procedure of region merging is implemented as a hierarchical clustering algorithm whereby a multiwindow approach using a pyramid-like structure is employed to increase computational efficiency while maintaining spatial connectivity in merging. From experiments with both simulated and remotely sensed data, the proposed method was determined to be quite effective for unsupervised analysis. In particular, the region-merging approach based on spatial contextual information was shown to provide more accurate classification of images with smooth spatial patterns.
Abstract | Full Text: PDF(1000 KB)    IEEE JNL
 
» Key
IEEE JNL IEEE Journal or Magazine
IEE JNL IEE Journal or Magazine
IEEE CNF IEEE Conference Proceeding
IEE CNF IEE Conference Proceeding
IEEE STD IEEE Standard
 
 
Indexed by IEE Inspec
© Copyright 2008 IEEE – All Rights Reserved