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Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment
Lee, Y.J.; Kane, T.; Lim, J.-J.; Schiano, L.; Kim, Y.-B.; Meyer, F.J.; Lombardi, F.; Max, S.;
Instrumentation and Measurement, IEEE Transactions on
Volume 52,
Issue 6,
Dec. 2003
Page(s):1749
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1755
Abstract:
This paper deals with the generation, measurement and modeling of the jitter encountered in the signals of a testhead board for automatic test equipment (ATE). A novel model is proposed for the jitter; this model takes into account the radiated electromagnetic interference (EMI) noise in the head of an ATE. The RMS value of the jitter is measured at the output signal of the testhead board to validate the proposed model. For measuring the RMS value, a novel circuitry has been designed on a daughter board to circumvent ground noise and connectivity problems arising from the head environment. An H-field is applied externally at the loop filter of a phase-locked loop (PLL), thus permitting the measurement of the RMS jitter to verify the transfer function between radiated EMI and jitter variation. The error between measured and predicted jitters is within a 15% level at both 200 kHz and 500 kHz.
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