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Evaluating the reliability of NAND multiplexing with PRISM
Norman, G.; Parker, D.; Kwiatkowska, M.; Shukla, S.;
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Volume 24,
Issue 10,
Oct. 2005
Page(s):1629
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1637
Abstract:
Probabilistic-model checking is a formal verification technique for analyzing the reliability and performance of systems exhibiting stochastic behavior. In this paper, we demonstrate the applicability of this approach and, in particular, the probabilistic-model-checking tool PRISM to the evaluation of reliability and redundancy of defect-tolerant systems in the field of computer-aided design. We illustrate the technique with an example due to von Neumann, namely NAND multiplexing. We show how, having constructed a model of a defect-tolerant system incorporating probabilistic assumptions about its defects, it is straightforward to compute a range of reliability measures and investigate how they are affected by slight variations in the behavior of the system. This allows a designer to evaluate, for example, the tradeoff between redundancy and reliability in the design. We also highlight errors in analytically computed reliability bounds, recently published for the same case study.
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