|
1. |
BPSK Bit Error Outage over Nakagami-m Fading Channels in Lognormal Shadowing Environments
Mary, P.; Dohler, M.; Gorce, J.-M.; Villemaud, G.; Arndt, M.;
Communications Letters, IEEE
Volume 11,
Issue 7,
July 2007
Page(s):565
-
567
Abstract:
In this letter, we address the problem of finding a tractable expression for the bit-error outage (BEO) defined as the probability to observe a given average bit error rate (BER) over a fading channel in a shadowing environment. Our contribution is two-fold: (1) a simple yet tight approximation of the bit error probability (BEP) for binary phase shift keying (BPSK) over a frequency-flat Nakagami-m fading channel is derived, which (2) facilitates the derivation of a tight lower bound of the BEO in presence of lognormal shadowing in closed form. Theoretical results are corroborated by means of simulation results, confirming the tightness of the bounds.
|
Cart
