Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
CrossRef Search
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
You requested this document:
1. Texture defect detection using the adaptive two-dimensional lattice filter
Meylani, R.; Ertuzun, A.; Ercil, A.;
Image Processing, 1996. Proceedings., International Conference on
Volume 3,  16-19 Sept. 1996 Page(s):165 - 168 vol.3
Abstract:

In this paper, the eight parameter two-dimensional adaptive lattice filter is used to detect defects in textures corresponding to raw textile fabrics. A novel histogram modification technique is also applied for preprocessing the gray level texture image. Moreover, with the proposed scheme, it is possible to detect defects using the defective image only
Abstract | Full Text: PDF(552 KB)    IEEE CNF
 
» Key
IEEE JNL IEEE Journal or Magazine
IEE JNL IEE Journal or Magazine
IEEE CNF IEEE Conference Proceeding
IEE CNF IEE Conference Proceeding
IEEE STD IEEE Standard
 
 
Indexed by IEE Inspec
© Copyright 2008 IEEE – All Rights Reserved