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Improving supply chain visibility through RFID data
Melski, A.; Muller, J.; Zeier, A.; Schumann, M.;
Data Engineering Workshop, 2008. ICDEW 2008. IEEE 24th International Conference on
7-12 April 2008
Page(s):102
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103
Abstract:
In our work, which is still in progress, we examine the visibility potentials of RFID technology within the context of Supply Chain Management (SCM). This analysis is conducted systematically by matching identified SCM visibility requirements and general RFID visibility potentials. Building on a four-step approach, we show how visibility in supply chains can be improved on the basis of RFID-generated data, and what impact this increase in visibility has on the goals of SCM.
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