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Probabilistic Event Extraction from RFID Data
Khoussainova, N.; Balazinska, M.; Suciu, D.;
Data Engineering, 2008. ICDE 2008. IEEE 24th International Conference on
7-12 April 2008
Page(s):1480
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1482
Abstract:
We present PEEX, a system that enables applications to define and extract meaningful probabilistic high-level events from RFID data. PEEX effectively copes with errors in the data and the inherent ambiguity of event extraction.
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