Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
CrossRef Search
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
You requested this document:
1. A boosting regression approach to medical anatomy detection
Zhou, S.K.; Jinghao Zhou; Comaniciu, D.;
Computer Vision and Pattern Recognition, 2007. CVPR '07. IEEE Conference on
17-22 June 2007 Page(s):1 - 8
Abstract:

The state-of-the-art object detection algorithm learns a binary classifier to differentiate the foreground object from the background. Since the detection algorithm exhaustively scans the input image for object instances by testing the classifier, its computational complexity linearly depends on the image size and, if say orientation and scale are scanned, the number of configurations in orientation and scale. We argue that exhaustive scanning is unnecessary when detecting medical anatomy because a medical image offers strong contextual information. We then present an approach to effectively leveraging the medical context, leading to a solution that needs only one scan in theory or several sparse scans in practice and only one integral image even when the rotation is considered. The core is to learn a regression function, based on an annotated database, that maps the appearance observed in a scan window to a displacement vector, which measures the difference between the configuration being scanned and that of the target object. To achieve the learning task, we propose an image-based boosting ridge regression algorithm, which exhibits good generalization capability and training efficiency. Coupled with a binary classifier as a confidence scorer, the regression approach becomes an effective tool for detecting left ventricle in echocardiogram, achieving improved accuracy over the state-of-the-art object detection algorithm with significantly less computation.
Abstract | Full Text: PDF(601 KB)    IEEE CNF
 
» Key
IEEE JNL IEEE Journal or Magazine
IEE JNL IEE Journal or Magazine
IEEE CNF IEEE Conference Proceeding
IEE CNF IEE Conference Proceeding
IEEE STD IEEE Standard
 
 
Indexed by IEE Inspec
© Copyright 2008 IEEE – All Rights Reserved