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Count-based BIST compaction schemes and aliasing probability computation
Ivanov, A.; Zorian, Y.;
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Volume 11,
Issue 6,
June 1992
Page(s):768
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777
Abstract:
The authors present a unified probabilistic model of count-based compaction that relates the probability of occurrence of the counted events to a circuit's fault detection probabilities. This model allows an identical treatment of all the different count-based techniques proposed to date, e.g. ones, transitions, edges, and spectral coefficients, by essentially reducing all techniques to simple ones-counting. From a Markov model of ones-counting, the authors derive asymptotic aliasing probabilities, and for finite test sequence lengths they developed a computation technique for determining the aliasing associated with the specifically mentioned schemes, as well as more general count-based compaction techniques, under various error models
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