Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
CrossRef Search
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
You requested this document:
1. The Amulet environment: new models for effective user interface software development
Myers, B.A.; McDaniel, R.G.; Miller, R.C.; Ferrency, A.S.; Faulring, A.; Kyle, B.D.; Mickish, A.; Klimovitski, A.; Doane, P.;
Software Engineering, IEEE Transactions on
Volume 23,  Issue 6,  June 1997 Page(s):347 - 365
Abstract:

The Amulet user interface development environment makes it easier for programmers to create highly interactive, graphical user interface software for Unix, Windows and the Macintosh. Amulet uses new models for objects, constraints, animation, input, output, commands, and undo. The object system is a prototype instance model in which there is no distinction between classes and instances or between methods and data. The constraint system allows any value of any object to be computed by arbitrary code and supports multiple constraint solvers. Animations can be attached to existing objects with a single line of code. Input from the user is handled by “interactor” objects which support reuse of behavior objects. The output model provides a declarative definition of the graphics and supports automatic refresh. Command objects encapsulate all of the information needed about operations, including support for various ways to undo them. A key feature of the Amulet design is that all graphical objects and behaviors of those objects are explicitly represented at run time, so the system can provide a number of high level built-in functions, including automatic display and editing of objects, and external analysis and control of interfaces. Amulet integrates these capabilities in a flexible and effective manner
Abstract | Full Text: PDF(1660 KB)    IEEE JNL
 
» Key
IEEE JNL IEEE Journal or Magazine
IEE JNL IEE Journal or Magazine
IEEE CNF IEEE Conference Proceeding
IEE CNF IEE Conference Proceeding
IEEE STD IEEE Standard
 
 
Indexed by IEE Inspec
© Copyright 2008 IEEE – All Rights Reserved