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A new model for the low-frequency noise and the noise level variation in polysilicon emitter BJTs
Sanden, M.; Marinov, O.; Deen, M.J.; Ostling, M.;
Electron Devices, IEEE Transactions on
Volume 49,
Issue 3,
March 2002
Page(s):514
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520
Abstract:
Presents a new, physically-based model for the low-frequency noise in high-speed polysilicon emitter bipolar junction transistors (BJTs). Evidence of the low-frequency noise originating mainly from a superposition of generation-recombination (g-r) centers is presented. Measurements of the equivalent input noise spectral density (SIB) showed that for BJTs with large emitter areas (AE) S(IB) is proportional to 1/f, as expected. In contrast, the noise spectrum for BJTs with submicron AE showed a strong variation from a 1/f-dependence, due to the presence of several g-r centers. However, the average spectrum ⟨S(IB)⟩ has a frequency dependence proportional to 1/f for BJTs with large as well as small AE. The proposed model, based only on superposition of g-r centers, can predict the frequency-, current-, area-, and variation-dependency of ⟨S(IB)⟩ with excellent agreement to the measured results
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