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A data reduction system for neutron crystallography using a two-dimensional planar multidetector is described. The method is based on an a priori calculation of the intensity distribution for each reflection for any crystal orientation. The orientation matrix of the crystal has to be known. From the calculated intensity distribution a mask is derived for each reflection. The detection elements of the detector which are inside the mask are summed to determine the intensity of that reflection and the cells outside are used to determine the background. The size of the mask is adapted to the relative height of the measured intensity of the reflector compared to the background. The theoretical intensity distribution for each reflection is calculated in reciprocal space from the primary-beam divergence and wavelength spread and the crystal mosaic spread, on the basis of the kinematic theory of diffraction. The derivation of the necessary equations, i.e. the determination of the resolution function of the instrument, is presented. Some typical results of data collection are also presented. The advantages of this data collection method are the safe determination of weak reflections, the easy discrimination of reflections which nearly overlap, the determination of crystal mosaic spread, and the discrimination of inelastic scattering in the proximity of intense reflections.
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