Fast Resistive Reconnection Regime in the Nonlinear Evolution of Double Tearing Modes

Z. X. Wang, X. G. Wang, J. Q. Dong, Y. A. Lei, Y. X. Long, Z. Z. Mou, and W. X. Qu
Phys. Rev. Lett. 99, 185004 – Published 2 November 2007

Abstract

Phases of nonlinear double tearing modes are studied numerically. The first two phases lead to the formation and growth of magnetic islands and are followed by a fast reconnection phase to complete the process, driven by a process of neighboring magnetic separatrices merging and magnetic islands coupling. The fast growth can be understood as a result of the island interaction equivalent to a steadily inward flux boundary driven. Resistivity dependences for various phases are studied and shown by scaling analysis for the first time. It is found that after an early Sweet-Parker phase with a η1/2-scale, a slow nonlinear phase in a Rutherford regime with a η1-scale is followed by the fast reconnection phase with a η1/5-scale.

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  • Received 12 January 2007

DOI:https://doi.org/10.1103/PhysRevLett.99.185004

©2007 American Physical Society

Authors & Affiliations

Z. X. Wang1, X. G. Wang2,*, J. Q. Dong3,4, Y. A. Lei2, Y. X. Long3, Z. Z. Mou3, and W. X. Qu3

  • 1State Key Lab of Materials Modifications by Beams, School of Physics and Optoelectronic Technology, Dalian University of Technology, Dalian, China 116024
  • 2School of Physics, Peking University, Beijing, China 100871
  • 3Southwestern Institute of Physics, P.O. Box 432, Chengdu, China 610041
  • 4Institute for Fusion Theory and Simulation, Zhejiang University, Hangzhou, China 310027

  • *The corresponding author: xgwang@pku.edu.cn

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Issue

Vol. 99, Iss. 18 — 2 November 2007

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