A new method, multiple-wave diffraction anomalous fine structure, combining the x-ray multiple-wave diffraction and diffraction anomalous fine structure techniques, is proposed. The real part of dispersion correction $\Delta f^{\prime }$ and fine structure $\chi$ function can be obtained directly by multiple diffraction analysis without using Kramers-Krönig relations and kinematical fitting of diffracted intensity. Better wave vector sensitivity of the fine structure is expected. The multiple-wave diffraction anomalous fine structure experiment for a GaAs single crystal is reported as an example.

• Received 19 June 2006

DOI:https://doi.org/10.1103/PhysRevLett.97.185502