Electrical Breakdown in Helium Cells at Low Temperature

B. Sethumadhavan, W. Yao, Y. H. Huang, R. E. Lanou, H. J. Maris, and G. M. Seidel

Phys. Rev. Lett. 97, 015301 – Published 5 July 2006

Abstract

Electrical breakdown of partially filled helium cells below 0.5 K is shown to be the result of Penning ionization of metastable triplet helium excimers bound to the surface of the liquid.

Received 30 March 2006

DOI:https://doi.org/10.1103/PhysRevLett.97.015301

Authors & Affiliations

B. Sethumadhavan, W. Yao, Y. H. Huang, R. E. Lanou, H. J. Maris, and G. M. Seidel

Physics Department, Brown University, Providence, Rhode Island 02912, USA

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Vol. 97, Iss. 1 — 7 July 2006

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Physical Review Letters

Electrical Breakdown in Helium Cells at Low Temperature

B. Sethumadhavan, W. Yao, Y. H. Huang, R. E. Lanou, H. J. Maris, and G. M. Seidel

Phys. Rev. Lett. 97, 015301 – Published 5 July 2006

Abstract

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