Collapse of Thermal Activation in Moderately Damped Josephson Junctions

V. M. Krasnov, T. Bauch, S. Intiso, E. Hürfeld, T. Akazaki, H. Takayanagi, and P. Delsing

Phys. Rev. Lett. 95, 157002 – Published 6 October 2005

Abstract

We study switching current statistics in moderately damped Nb-InAs-Nb and intrinsic ${Bi}_{2} {Sr}_{2} {CaCu}_{2} O_{8 + δ}$ Josephson junctions. A paradoxical collapse of thermal activation with increasing temperature is reported and explained by the interplay of two conflicting consequences of thermal fluctuations, which can both assist in premature escape and help in retrapping back into the stationary state. We analyze the influence of dissipation on the thermal escape by tuning damping with a gate voltage, magnetic field, temperature, and an in situ capacitor.

Received 28 February 2005

DOI:https://doi.org/10.1103/PhysRevLett.95.157002

Authors & Affiliations

V. M. Krasnov¹, T. Bauch², S. Intiso², E. Hürfeld², T. Akazaki³, H. Takayanagi³, and P. Delsing²

¹Department of Physics, Stockholm University, Albanova University Center, SE-10691 Stockholm, Sweden
²Department of Microtechnology and Nanoscience, Chalmers University of Technology, SE-41296 Göteborg, Sweden
³NTT Basic Research Laboratories, 3-1 Morinosato-Wakamiya, Atsugi-Shi, Kanagawa 243-01, Japan

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Issue

Vol. 95, Iss. 15 — 7 October 2005

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