Abstract
Nickel disilicide/silicon (001) interfaces were investigated by aberration corrected scanning transmission electron microscopy (STEM). The atomic structure was derived directly from the high spatial resolution high angle annular dark field STEM images without recourse to image simulation. It comprises fivefold coordinated silicon and sevenfold coordinated nickel sites at the interface and shows a reconstruction. The proposed structure has not been experimentally observed before but has been recently predicted theoretically by others to be energetically favored.
- Received 21 March 2003
DOI:https://doi.org/10.1103/PhysRevLett.92.116103
©2004 American Physical Society