Atomic Structure of a (2×1) Reconstructed NiSi2/Si(001) Interface

Uwe Falke, Andrew Bleloch, Meiken Falke, and Steffen Teichert
Phys. Rev. Lett. 92, 116103 – Published 19 March 2004

Abstract

Nickel disilicide/silicon (001) interfaces were investigated by aberration corrected scanning transmission electron microscopy (STEM). The atomic structure was derived directly from the high spatial resolution high angle annular dark field STEM images without recourse to image simulation. It comprises fivefold coordinated silicon and sevenfold coordinated nickel sites at the interface and shows a 2×1 reconstruction. The proposed structure has not been experimentally observed before but has been recently predicted theoretically by others to be energetically favored.

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  • Received 21 March 2003

DOI:https://doi.org/10.1103/PhysRevLett.92.116103

©2004 American Physical Society

Authors & Affiliations

Uwe Falke*, Andrew Bleloch, and Meiken Falke

  • UK SuperSTEM, Daresbury Laboratory, Daresbury WA4 4AD, United Kingdom

Steffen Teichert

  • Institut für Physik, TU Chemnitz, 09107 Chemnitz, Germany

  • *Electronic address: falke@liv.ac.uk
  • Present address: Freiberger Compound Materials GmbH, Am Junger Löwe Schacht 5, D-09599 Freiberg, Germany.

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Issue

Vol. 92, Iss. 11 — 19 March 2004

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