Abstract
We have carried out a direct measurement of the degree of spin polarization () of the magnetic semiconductor using Andreev reflection spectroscopy. Analyses of the conductance spectra of high transparency junctions consistently yield an intrinsic value for greater than 85%. Our experiments also revealed an extreme sensitivity of the measured spin polarization to the nature and quality of the interface for this material.
- Received 31 January 2003
DOI:https://doi.org/10.1103/PhysRevLett.91.056602
©2003 American Physical Society