Direct Measurement of Transverse Coherence Length of Hard X Rays from Interference Fringes

V. Kohn, I. Snigireva, and A. Snigirev
Phys. Rev. Lett. 85, 2745 – Published 25 September 2000
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Abstract

We propose a simple interferometric technique for hard x-ray spatial coherence characterization, recording a Fresnel interference pattern produced by a round fiber or a slit. We have derived analytical formulas that give a direct relation between a visibility of interference fringes and either the source size or the transverse coherence length. The technique is well suited to third-generation synchrotron radiation sources and was experimentally applied to determine the spatial coherence length and the source size at the European Synchrotron Radiation Facility.

  • Received 17 November 1999

DOI:https://doi.org/10.1103/PhysRevLett.85.2745

©2000 American Physical Society

Authors & Affiliations

V. Kohn1, I. Snigireva2, and A. Snigirev2,*

  • 1Russian Research Centre “Kurchatov Institute,” 123182 Moscow, Russia
  • 2European Synchrotron Radiation Facility, B.P. 220, F-38043, Grenoble Cedex, France

  • *Email address: snigirev@esrf.fr

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Vol. 85, Iss. 13 — 25 September 2000

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