Controlled Dephasing of Electrons via a Phase Sensitive Detector

D. Sprinzak, E. Buks, M. Heiblum, and H. Shtrikman
Phys. Rev. Lett. 84, 5820 – Published 19 June 2000
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Abstract

We demonstrate a controlled dephasing experiment via exploiting a unique entangled interferometer-detector system, realized in an electronic mesoscopic structure. We study the dephasing process both from the which path information available in the detector and, alternatively, from the direct effect of the detector on the interferometer. Detection is possible only due to an induced phase change in the detector. Even though this phase change cannot actually be measured, strong dephasing of the interferometer took place. The intricate role of detector's noise and coherency are investigated.

  • Received 21 January 2000

DOI:https://doi.org/10.1103/PhysRevLett.84.5820

©2000 American Physical Society

Authors & Affiliations

D. Sprinzak, E. Buks*, M. Heiblum, and H. Shtrikman

  • Braun Center for Submicron Research, Department of Condensed Matter Physics, Weizmann Institute of Science, Rehovot 76100, Israel

  • *Present address: Condensed Matter Physics, California Institute of Technology, Pasadena, CA 91125.

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Vol. 84, Iss. 25 — 19 June 2000

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