Observation of Midgap Interface States in Buried Metal/GaAs Junctions

J. Qi, W. Angerer, M. S. Yeganeh, A. G. Yodh, and W. M. Theis
Phys. Rev. Lett. 75, 3174 – Published 23 October 1995
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Abstract

Second-order nonlinear optical spectroscopies reveal midgap interface states at buried metal/GaAs junctions, and demonstrate that these states are sensitive to interface preparation. In As-rich (Ga-rich) Au/GaAs n-type samples one (two) midgap resonance was observed. Similar resonances were exhibited in As/GaAs n-type samples, but were not present in metal/GaAs p-type systems. The sharp spectral features provide compelling evidence for the existence and symmetry of atomic displacement-induced defect states just below the buried interface.

  • Received 9 June 1995

DOI:https://doi.org/10.1103/PhysRevLett.75.3174

©1995 American Physical Society

Authors & Affiliations

J. Qi, W. Angerer, M. S. Yeganeh, and A. G. Yodh

  • Department of Physics, University of Pennsylvania, Philadelphia, Pennsylvania 19104

W. M. Theis

  • Naval Air Warfare Center, China Lake, California 93555

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Vol. 75, Iss. 17 — 23 October 1995

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