Speckle-Based X-Ray Phase-Contrast and Dark-Field Imaging with a Laboratory Source

I. Zanette, T. Zhou, A. Burvall, U. Lundström, D. H. Larsson, M. Zdora, P. Thibault, F. Pfeiffer, and H. M. Hertz
Phys. Rev. Lett. 112, 253903 – Published 26 June 2014
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Abstract

We report on the observation and application of near-field speckles with a laboratory x-ray source. The detection of speckles is possible thanks to the enhanced brilliance properties of the used liquid-metal-jet source, and opens the way to a range of new applications in laboratory-based coherent x-ray imaging. Here, we use the speckle pattern for multimodal imaging of demonstrator objects. Moreover, we introduce algorithms for phase and dark-field imaging using speckle tracking, and we show that they yield superior results with respect to existing methods.

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  • Received 19 March 2014

DOI:https://doi.org/10.1103/PhysRevLett.112.253903

© 2014 American Physical Society

Authors & Affiliations

I. Zanette1,*, T. Zhou2, A. Burvall2, U. Lundström2, D. H. Larsson2, M. Zdora1, P. Thibault3, F. Pfeiffer1, and H. M. Hertz2

  • 1Physik-Department, Technische Universität München, Garching 85748, Germany
  • 2Department of Applied Physics, KTH Royal Institute of Technology, Stockholm 106 91, Sweden
  • 3Department of Physics & Astronomy, University College London, London WC1E 6BT, United Kingdom

  • *irene.zanette@tum.de

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Issue

Vol. 112, Iss. 25 — 27 June 2014

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