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Charge Relaxation in a Single-Electron Si/SiGe Double Quantum Dot

K. Wang, C. Payette, Y. Dovzhenko, P. W. Deelman, and J. R. Petta
Phys. Rev. Lett. 111, 046801 – Published 22 July 2013
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Abstract

We measure the interdot charge relaxation time T1 of a single electron trapped in an accumulation mode Si/SiGe double quantum dot. The energy level structure of the charge qubit is determined using photon assisted tunneling, which reveals the presence of a low-lying excited state. We systematically measure T1 as a function of detuning and interdot tunnel coupling and show that it is tunable over four orders of magnitude, with a maximum of 45μs for our device configuration.

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  • Received 11 April 2013

DOI:https://doi.org/10.1103/PhysRevLett.111.046801

© 2013 American Physical Society

Authors & Affiliations

K. Wang1, C. Payette1, Y. Dovzhenko1, P. W. Deelman2, and J. R. Petta1,3,*

  • 1Department of Physics, Princeton University, Princeton, New Jersey 08544, USA
  • 2HRL Laboratories LLC, 3011 Malibu Canyon Road, Malibu, California 90265, USA
  • 3Princeton Institute for the Science and Technology of Materials (PRISM), Princeton University, Princeton, New Jersey 08544, USA

  • *petta@princeton.edu

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Issue

Vol. 111, Iss. 4 — 26 July 2013

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