Understanding the Clean Interface between Covalent Si and Ionic Al2O3

H. J. Xiang, Juarez L. F. Da Silva, Howard M. Branz, and Su-Huai Wei
Phys. Rev. Lett. 103, 116101 – Published 9 September 2009

Abstract

The atomic and electronic structures of the (001)Si/(001)γAl2O3 heterointerface are investigated by first principles total energy calculations combined with a newly developed “modified basin-hopping” method. It is found that all interface Si atoms are fourfold coordinated due to the formation of Si-O and unexpected covalent Si-Al bonds in the new abrupt interface model. And the interface has perfect electronic properties in that the unpassivated interface has a large LDA band gap and no gap levels. These results show that it is possible to have clean semiconductor-oxide interfaces.

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  • Received 3 March 2009

DOI:https://doi.org/10.1103/PhysRevLett.103.116101

©2009 American Physical Society

Authors & Affiliations

H. J. Xiang, Juarez L. F. Da Silva, Howard M. Branz, and Su-Huai Wei

  • National Renewable Energy Laboratory, Golden, Colorado 80401, USA

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Issue

Vol. 103, Iss. 11 — 11 September 2009

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