Determination of interfacial thermal resistance at the nanoscale

Lin Hu, Tapan Desai, and Pawel Keblinski
Phys. Rev. B 83, 195423 – Published 10 May 2011

Abstract

Using molecular dynamics simulations and model graphene layers in an organic matrix we demonstrate that interfacial thermal resistance determined via thermal relaxation method is up to an order of magnitude larger than that determined from direct simulation method of heat transfer across the matrix-graphene-matrix interface. We provide an explanation of this difference based on the spectral analysis of the frequency-dependent vibrational temperature. The importance of our finding lies in the fact that the relaxation method mimics experimental laser-based pump-probe measurements of the interfacial thermal resistance, while the direct simulation method provides information relevant to predicting and understanding thermal conductivity of nanocomposites.

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  • Received 7 February 2011

DOI:https://doi.org/10.1103/PhysRevB.83.195423

©2011 American Physical Society

Authors & Affiliations

Lin Hu1, Tapan Desai2, and Pawel Keblinski1,*

  • 1Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180, USA
  • 2Advanced Cooling Technologies, Inc., Lancaster, Pennsylvania 17601, USA

  • *Corresponding author: keblip@rpi.edu

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Issue

Vol. 83, Iss. 19 — 15 May 2011

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