Finite size and intrinsic field effect on the polar-active properties of ferroelectric-semiconductor heterostructures

A. N. Morozovska, E. A. Eliseev, S. V. Svechnikov, A. D. Krutov, V. Y. Shur, A. Y. Borisevich, P. Maksymovych, and S. V. Kalinin
Phys. Rev. B 81, 205308 – Published 7 May 2010

Abstract

Using Landau-Ginzburg-Devonshire approach we calculated the equilibrium distributions of electric field, polarization, and space charge in the ferroelectric-semiconductor heterostructures containing proper or incipient ferroelectric thin films. The role of the polarization gradient and intrinsic surface energy, interface dipoles, and free charges on polarization dynamics are specifically explored. The intrinsic field effects, which originated at the ferroelectric-semiconductor interface, lead to the surface band bending and result into the formation of depletion space-charge layer near the semiconductor surface. During the local polarization reversal (caused by the electric field of the nanosized tip of the scanning probe microscope) the thickness and charge of the interface layer drastically changes, in particular, the sign of the screening carriers is determined by the polarization direction. Obtained analytical solutions could be extended to analyze polarization-mediated electronic transport.

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  • Received 31 December 2009

DOI:https://doi.org/10.1103/PhysRevB.81.205308

©2010 American Physical Society

Authors & Affiliations

A. N. Morozovska1,*, E. A. Eliseev1,2, S. V. Svechnikov1, A. D. Krutov1,3, V. Y. Shur4, A. Y. Borisevich5, P. Maksymovych5, and S. V. Kalinin5,†

  • 1Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, 03028 Kiev, Ukraine
  • 2Institute for Problems of Materials Science, National Academy of Sciences of Ukraine, 03142 Kiev, Ukraine
  • 3Taras Shevchenko National University of Kyiv, 01033 Kiev, Ukraine
  • 4Institute of Physics and Applied Mathematics, Ural State University, 620083 Ekaterinburg, Russia
  • 5Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

  • *morozo@i.com.ua
  • sergei2@ornl.gov

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Vol. 81, Iss. 20 — 15 May 2010

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