Reply to ‘‘Comment on ‘Semimetal-to-semiconductor transition in bismuth thin films’ ’’

C. A. Hoffman, J. R. Meyer, F. J. Bartoli, A. Di Venere, X. J. Yi, C. L. Hou, H. C. Wang, J. B. Ketterson, and G. K. Wong
Phys. Rev. B 51, 5535 – Published 15 February 1995
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Abstract

The suppression of intrinsic carrier generation does not in itself constitute proof that a semimetal-to-semiconductor transition has occurred. However, we present a realistic statistical analysis that demonstrates that the Bi film data do in fact imply the opening of a ≊56-meV energy gap in the thinnest sample (200 Å) studied. The standard vanishing-wave-function model accounts for the experimental observations, whereas the alternative vanishing-gradient model yields results that are inherently inconsistent with the data.

  • Received 2 June 1994

DOI:https://doi.org/10.1103/PhysRevB.51.5535

©1995 American Physical Society

Authors & Affiliations

C. A. Hoffman, J. R. Meyer, and F. J. Bartoli

  • Code 5613, Naval Research Laboratory, Washington, D.C. 20375

A. Di Venere, X. J. Yi, C. L. Hou, H. C. Wang, J. B. Ketterson, and G. K. Wong

  • Department of Physics and Astronomy, Northwestern University, Evanston, Illinois 60208

Comments & Replies

Original Article

Semimetal-to-semiconductor transition in bismuth thin films

C. A. Hoffman, J. R. Meyer, F. J. Bartoli, A. Di Venere, X. J. Yi, C. L. Hou, H. C. Wang, J. B. Ketterson, and G. K. Wong
Phys. Rev. B 48, 11431 (1993)

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Vol. 51, Iss. 8 — 15 February 1995

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