One-dimensional topological defect observed in Ni-Mo amorphous films

C. H. Shang, B. X. Liu, and H. D. Li
Phys. Rev. B 44, 7302 – Published 1 October 1991
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Abstract

When as-vitrified Ni-Mo films are irradiated to a critical dose by 200-keV xenon ions at room temperature, many fine enclosed curves with widths in the range 2–15 nm are observed in an amorphous matrix by transmission electron microscopy. The enclosed curves are attributed to one-dimensional topological defects in amorphous solids. Rich microstructures pertinent to the line defect are described in detail, and elucidated in terms of the elastic theory of continuum media.

  • Received 20 February 1991

DOI:https://doi.org/10.1103/PhysRevB.44.7302

©1991 American Physical Society

Authors & Affiliations

C. H. Shang, B. X. Liu, and H. D. Li

  • Department of Materials Science and Engineering, Tsinghua University, Beijing 100084, China

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Issue

Vol. 44, Iss. 14 — 1 October 1991

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