Transient moment relaxation in high-temperature superconductors

Y. Y. Xue, L. Gao, Y. T. Ren, W. C. Chan, P. H. Hor, and C. W. Chu
Phys. Rev. B 44, 12029 – Published 1 December 1991
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Abstract

The decays of the persistent supercurrent have been derived for several characteristic I-V relationships with few sample-dependent parameters. The results are compared with recent short-time flux-creep data in a short ‘‘transient’’ time window (104102 s). The results favor the I-V characteristics V∝exp[-(I0/I)μ], as predicted by the collective-pinning and vortex-glass models. However, the μ so obtained is greater than 1, in contrast with that predicted. This may imply a different type of vortex elemental excitation observed in our low-field conditions.

  • Received 30 July 1991

DOI:https://doi.org/10.1103/PhysRevB.44.12029

©1991 American Physical Society

Authors & Affiliations

Y. Y. Xue, L. Gao, Y. T. Ren, W. C. Chan, P. H. Hor, and C. W. Chu

  • Texas Center for Superconductivity, University of Houston, Houston, Texas 77204-5932

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Vol. 44, Iss. 21 — 1 December 1991

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