Coverage and structure of ultrathin Pd films on Cu(100)

T. D. Pope, G. W. Anderson, K. Griffiths, P. R. Norton, and G. W. Graham
Phys. Rev. B 44, 11518 – Published 15 November 1991
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Abstract

The deposition of Pd on Cu(100) at 300 K was studied by low-energy electron diffraction (LEED), Auger-electron spectroscopy, and Rutherford-backscattering spectrometry. A clear maximum in the c(2×2) LEED pattern intensity occurred at a Pd coverage of 0.55±0.05 monolayers (ML), consistent with the surface-alloy model for this system. Breakpoints in the Auger intensity versus deposition-time curves were seen at 0.47±0.05 and 0.93±0.11 ML. A p(2×2) LEED pattern was observed near 1-ML Pd coverage.

  • Received 30 May 1991

DOI:https://doi.org/10.1103/PhysRevB.44.11518

©1991 American Physical Society

Authors & Affiliations

T. D. Pope, G. W. Anderson, K. Griffiths, and P. R. Norton

  • Interface Science Western, University of Western Ontario, London, Ontario, Canada N6A 5B7

G. W. Graham

  • Research Staff, Ford Motor Company, Dearborn, Michigan 48121

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Vol. 44, Iss. 20 — 15 November 1991

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