Excitation hot-electron spectroscopy

K. K. Choi, M. Dutta, P. G. Newman, L. Calderon, W. Chang, and G. J. Iafrate
Phys. Rev. B 42, 9166 – Published 15 November 1990
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Abstract

A novel spectroscopy that combines hot-electron transport methodology with external excitation stimulation is utilized to elucidate the energy spectrum of multiple-quantum-well structures. The energy distribution of carriers measured from this spectroscopy using both thermal and optical stimulation reveals the important transport mechanisms in the structure. For the multiple-quantum-well structure studied in this paper, it is noted that the energy distribution of the photoexcited electrons is extremely narrow and well separated from the lower-energy electrons; this observation is utilized to propose a new low-noise infrared transistor for liquid-nitrogen temperature operation.

  • Received 7 June 1990

DOI:https://doi.org/10.1103/PhysRevB.42.9166

©1990 American Physical Society

Authors & Affiliations

K. K. Choi, M. Dutta, P. G. Newman, L. Calderon, W. Chang, and G. J. Iafrate

  • U.S. Army Electronics Technology and Devices Laboratory, Fort Monmouth, New Jersey 07703-5000

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Issue

Vol. 42, Iss. 14 — 15 November 1990

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