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Negative-U property of the DX center in AlxGa1xAs:Si

M. F. Li, Y. B. Jia, P. Y. Yu, J. Zhou, and J. L. Gao
Phys. Rev. B 40, 1430(R) – Published 15 July 1989
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Abstract

We present two major points in this paper: (1) Statistics derived from the negative-U property of the DX center are not consistent with existing Hall experiments of Si-doped AlxGa1xAs. (2) The discrepancy between the negative-U model and Hall experiments can be improved if there exist two different donors SD and DX with comparable concentrations NSD and NDX, NSD/NDX increases with increasing NSi. DX is a negative-U center binding two electrons and SD is a shallow donor. SD centers provide electrons and the electrons are captured by DX centers, and therefore the Fermi energy is no longer pinned to the DX energy level. Many experiments are reinterpreted in this view.

  • Received 30 January 1989

DOI:https://doi.org/10.1103/PhysRevB.40.1430

©1989 American Physical Society

Authors & Affiliations

M. F. Li

  • Center of Theoretical Physics, Chinese Center of Advanced Science aduate Technology (World Laboratory), 52 Sanlihe Road, Beijing, China
  • Graduate School, University of Science and Technology of China, Academia Sinica, P.O. Box 3908, Beijing, China

Y. B. Jia

  • Graduate School, University of Science and Technology of China, Academia Sinica, P.O. Box 3908, Beijing, China

P. Y. Yu

  • Department of Physics, University of California, Berkeley, Berkeley, California 94720
  • Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, Berkeley, California 94720

J. Zhou and J. L. Gao

  • Institute of Semiconductors, Academia Sinica, Beijing, China

Comments & Replies

Reply to ‘‘Comment on ‘Negative-U property of the DX center in AlxGa1xAs:Si’ ’’

M. F. Li, P. Y. Yu, Y. B. Jia, J. Zhou, and J. L. Gao
Phys. Rev. B 42, 9711 (1990)

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Vol. 40, Iss. 2 — 15 July 1989

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