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Photoelectron paramagnetic resonance of Pt in silicon

P. Omling, P. Emanuelsson, and H. G. Grimmeiss
Phys. Rev. B 36, 6202(R) – Published 15 October 1987
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Abstract

The Pt center in silicon has been identified by its characteristic electron-paramagnetic-resonance (EPR) signal. From photo-EPR measurements, the optical cross sections of holes for the Pt(0/-) transition have been determined at T=4.2 K. A comparison with corresponding optical cross sections obtained for the commonly observed deep acceptor level in Pt-doped Si at T=80 K with junction space-charge methods shows that the Pt center is, indeed, the impurity which gives rise to the Ec0.23 eV acceptor level.

  • Received 5 June 1987

DOI:https://doi.org/10.1103/PhysRevB.36.6202

©1987 American Physical Society

Authors & Affiliations

P. Omling, P. Emanuelsson, and H. G. Grimmeiss

  • Department of Solid State Physics, University of Lund, Box 118, S-221 00 Lund, Sweden

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Issue

Vol. 36, Iss. 11 — 15 October 1987

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