Abstract
The center in silicon has been identified by its characteristic electron-paramagnetic-resonance (EPR) signal. From photo-EPR measurements, the optical cross sections of holes for the Pt(0/-) transition have been determined at K. A comparison with corresponding optical cross sections obtained for the commonly observed deep acceptor level in Pt-doped Si at K with junction space-charge methods shows that the center is, indeed, the impurity which gives rise to the eV acceptor level.
- Received 5 June 1987
DOI:https://doi.org/10.1103/PhysRevB.36.6202
©1987 American Physical Society