Abstract
The theory of x-ray diffraction for smectic-A films is presented. The effect of the smectic layer fluctuations and correlations and the molecular form factor on the interlayer structure and the x-ray diffraction pattern is discussed. The application of the presented theory to smectic-C, smectic-I, smectic-, and smectic- films is suggested.
- Received 10 September 1990
DOI:https://doi.org/10.1103/PhysRevA.42.7511
©1990 American Physical Society