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Interlayer structure of thin smectic films from their x-ray diffraction patterns

Robert Hol/yst
Phys. Rev. A 42, 7511(R) – Published 1 December 1990
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Abstract

The theory of x-ray diffraction for smectic-A films is presented. The effect of the smectic layer fluctuations and correlations and the molecular form factor on the interlayer structure and the x-ray diffraction pattern is discussed. The application of the presented theory to smectic-C, smectic-I, smectic-Ad, and smectic-A2 films is suggested.

  • Received 10 September 1990

DOI:https://doi.org/10.1103/PhysRevA.42.7511

©1990 American Physical Society

Authors & Affiliations

Robert Hol/yst

  • Department of Physics, FM-15, University of Washington, Seattle, Washington 98195

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Vol. 42, Iss. 12 — December 1990

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