Transport phenomena in nanofluidics

Reto B. Schoch, Jongyoon Han, and Philippe Renaud
Rev. Mod. Phys. 80, 839 – Published 17 July 2008

Abstract

The transport of fluid in and around nanometer-sized objects with at least one characteristic dimension below 100nm enables the occurrence of phenomena that are impossible at bigger length scales. This research field was only recently termed nanofluidics, but it has deep roots in science and technology. Nanofluidics has experienced considerable growth in recent years, as is confirmed by significant scientific and practical achievements. This review focuses on the physical properties and operational mechanisms of the most common structures, such as nanometer-sized openings and nanowires in solution on a chip. Since the surface-to-volume ratio increases with miniaturization, this ratio is high in nanochannels, resulting in surface-charge-governed transport, which allows ion separation and is described by a comprehensive electrokinetic theory. The charge selectivity is most pronounced if the Debye screening length is comparable to the smallest dimension of the nanochannel cross section, leading to a predominantly counterion containing nanometer-sized aperture. These unique properties contribute to the charge-based partitioning of biomolecules at the microchannel-nanochannel interface. Additionally, at this free-energy barrier, size-based partitioning can be achieved when biomolecules and nanoconstrictions have similar dimensions. Furthermore, nanopores and nanowires are rooted in interesting physical concepts, and since these structures demonstrate sensitive, label-free, and real-time electrical detection of biomolecules, the technologies hold great promise for the life sciences. The purpose of this review is to describe physical mechanisms on the nanometer scale where new phenomena occur, in order to exploit these unique properties and realize integrated sample preparation and analysis systems.

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    DOI:https://doi.org/10.1103/RevModPhys.80.839

    ©2008 American Physical Society

    Authors & Affiliations

    Reto B. Schoch*

    • Microsystems Laboratory, STI-LMIS, École Polytechnique Fédérale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, USA; and Department of Biological Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, USA

    Jongyoon Han

    • Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, USA; and Department of Biological Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, USA

    Philippe Renaud

    • Microsystems Laboratory, STI-LMIS, École Polytechnique Fédérale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland

    • *Present address: Department of Mechanical Engineering, Stanford University, Stanford, CA 94305, USA. Author to whom correspondence should be addressed. reto.schoch@a3.epfl.ch

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    Issue

    Vol. 80, Iss. 3 — July - September 2008

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