Multiphoton Double Ionization via Field-Independent Resonant Excitation

J. Rudati, J. L. Chaloupka, P. Agostini, K. C. Kulander, and L. F. DiMauro
Phys. Rev. Lett. 92, 203001 – Published 19 May 2004

Abstract

The double ionization of xenon in the multiphoton regime has been studied at two wavelengths (0.77 and 0.79μm) using an electron-ion coincidence technique and an intensity binned ion ratio method. Sharp resonant structures in the electron energy distribution correlated with the doubly charged ion, as well as a wavelength dependence of the Xe2+/Xe+ ratio provides new insights. A mechanism involving the shelving of population in Rydberg states followed by excitation of a core electron is proposed.

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  • Received 3 September 2003

DOI:https://doi.org/10.1103/PhysRevLett.92.203001

©2004 American Physical Society

Authors & Affiliations

J. Rudati1, J. L. Chaloupka2, P. Agostini3, K. C. Kulander4, and L. F. DiMauro1

  • 1Chemistry Department, Brookhaven National Laboratory, Upton, New York 11973, USA
  • 2Department of Physics, College of William & Mary, Williamsburg, Virginia 23187-8795, USA
  • 3CEA/DSM, Centre d’Etudes de Saclay, 91191 Gif Sur Yvette, France
  • 4V Division, Lawrence Livermore National Laboratory, Livermore, California 94551, USA

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Issue

Vol. 92, Iss. 20 — 21 May 2004

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