X-Ray Interferometry with Microelectronvolt Resolution

Yu. V. Shvyd’ko, M. Lerche, H.-C. Wille, E. Gerdau, M. Lucht, H. D. Rüter, E. E. Alp, and R. Khachatryan
Phys. Rev. Lett. 90, 013904 – Published 10 January 2003

Abstract

We demonstrate an interferometer for hard x rays with two back-reflecting sapphire crystal mirrors—a prototype x-ray Fabry-Pérot interferometer. A finesse of 15 and 0.76μeV broad Fabry-Pérot transmission resonances are measured by the time response of the interferometer. Interference patterns are observed directly in spectral dependences of reflectivity.

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  • Received 5 August 2002

DOI:https://doi.org/10.1103/PhysRevLett.90.013904

©2003 American Physical Society

Authors & Affiliations

Yu. V. Shvyd’ko*, M. Lerche, H.-C. Wille, E. Gerdau, M. Lucht, and H. D. Rüter

  • Institut für Experimentalphysik, Universität Hamburg, D-22761 Germany

E. E. Alp and R. Khachatryan

  • Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439

  • *Electronic address: Yuri.Shvydko@desy.de

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Issue

Vol. 90, Iss. 1 — 10 January 2003

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