X-Ray Diffraction Measurement of the Effect of Layer Thickness on the Ferroelectric Transition in Epitaxial KTaO3/KNbO3 Multilayers

E. D. Specht, H.-M. Christen, D. P. Norton, and L. A. Boatner
Phys. Rev. Lett. 80, 4317 – Published 11 May 1998
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Abstract

KTaO3/KNbO3 strained-layer superlattices of variable periodicity were grown by pulsed laser deposition on KTaO3 substrates. The KNbO3 layers were found to be strained in plane to match the substrate lattice parameter. Therefore, the applied strain is independent of the layer thickness. High-temperature x-ray diffraction was used to measure the ferroelectric-paraelectric phase transition temperature Tc. For superlattice periodicity Λ5.1nm, Tc=475K, independent of Λ. For Λ>5.1nm, Tc increases to 825 K at Λ=33.8nm.

  • Received 17 November 1997

DOI:https://doi.org/10.1103/PhysRevLett.80.4317

©1998 American Physical Society

Authors & Affiliations

E. D. Specht*, H.-M. Christen†,‡, D. P. Norton§, and L. A. Boatner

  • Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6118

  • *Metals and Ceramics Division. Internet: esy@ornl.gov.
  • Solid State Division.
  • Present address: Neocera, 10000 Virginia Manor Road Suite 300, Beltsville, MD 20705-4215.
  • §

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Vol. 80, Iss. 19 — 11 May 1998

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