Measurements of Radiation Pressure Effect in Cryogenic Sapphire Dielectric Resonators

S. Chang, A. G. Mann, A. N. Luiten, and D. G. Blair
Phys. Rev. Lett. 79, 2141 – Published 15 September 1997
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Abstract

We report observations of the radiation pressure induced expansion of a solid dielectric resonator. This effect causes a fundamental limit to the frequency stability of the resonator. The measurements were made on four high Q-factor quasi-TE “whispering gallery” modes from 9.9 to 12.6 GHz in a monocrystalline sapphire resonator at liquid helium temperatures. The fractional frequency shift is 1.0±0.1×1012 per μJ of energy stored in the resonator. This result is consistent in sign, magnitude, and linearity with the radiation pressure induced lattice expansion term predicted by Braginsky.

  • Received 14 April 1997

DOI:https://doi.org/10.1103/PhysRevLett.79.2141

©1997 American Physical Society

Authors & Affiliations

S. Chang, A. G. Mann, A. N. Luiten, and D. G. Blair

  • Department of Physics, The University of Western Australia, Nedlands, W A 6907, Australia

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Vol. 79, Iss. 11 — 15 September 1997

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