Complete fragmentation pattern for two-step double photoionization in xenon

B. Kämmerling and V. Schmidt
Phys. Rev. Lett. 67, 1848 – Published 30 September 1991
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Abstract

An extensive study of the 4f5/2 photoionization in xenon is presented which allows, through the observation of the coincident N5O23O23 1S0 Auger electron, the establishment of the first complete fragmentation pattern for two-electron emission with information on the momenta and the spin projections of both electrons.

  • Received 15 July 1991

DOI:https://doi.org/10.1103/PhysRevLett.67.1848

©1991 American Physical Society

Authors & Affiliations

B. Kämmerling and V. Schmidt

  • Fakultät für Physik, Universität Freiburg, D-7800 Freiburg, Germany

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Issue

Vol. 67, Iss. 14 — 30 September 1991

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