Surface-Plasmon-One-Electron Decay and its Observation in Photoemission

J. G. Endriz and W. E. Spicer
Phys. Rev. Lett. 24, 64 – Published 12 January 1970
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Abstract

Evidence for the decay of surface plasmons into one-electron excitations has been obtained in photoemission measurements from a slightly roughened surface of aluminum. A simple theory has been developed which explains the resultant photoyield in terms of both the drop in reflectance resulting from roughness-aided plasmon coupling, and the relative penetration depth of the fields associated with these excited plasmons.

  • Received 23 October 1969

DOI:https://doi.org/10.1103/PhysRevLett.24.64

©1970 American Physical Society

Authors & Affiliations

J. G. Endriz and W. E. Spicer

  • Stanford Electronics Laboratory, Stanford University, Stanford, California 94305

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Issue

Vol. 24, Iss. 2 — 12 January 1970

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