We introduce a model for describing the defected growth of striped patterns. This model, while roughly related to the Swift-Hohenberg model, generates a quite different mixture of defects during phase ordering. We find two characteristic lengths in the system: the scaling length $L\left(t\right),$ and the average width of the domain walls. The growth law exponent is larger than the value of $1/2$ found in typical point defect systems.

• Received 31 July 2003

DOI:https://doi.org/10.1103/PhysRevE.69.011104