Frequency-dependent reflectivity of shock-compressed xenon plasmas

H. Reinholz, Yu. Zaporoghets, V. Mintsev, V. Fortov, I. Morozov, and G. Röpke
Phys. Rev. E 68, 036403 – Published 26 September 2003
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Abstract

Results for the reflection coefficient of shock-compressed dense xenon plasmas at pressures of 1.6–20 GPa and temperatures around 30 000 K using laser beams of wavelengths 1.06μm and 0.694μm are presented, which indicate metallic behavior at high densities. For the theoretical description of the experiments, a quantum statistical approach to the dielectric function is used. The comparison with molecular dynamics simulations is discussed. We conclude that reflectivity measurements at different wavelengths can provide information about the density profile of the shock wave front.

  • Received 23 February 2003

DOI:https://doi.org/10.1103/PhysRevE.68.036403

©2003 American Physical Society

Authors & Affiliations

H. Reinholz*

  • School of Physics, University of Western Australia, 35 Stirling Highway, Crawley, Western Australia 6009, Australia

Yu. Zaporoghets, V. Mintsev, and V. Fortov

  • Institute of Problems of Chemical Physics, Chernogolovka, Moscow Region 142432, Russia

I. Morozov

  • Institute for High Energy Densities of RAS, IHED-IVTAN, Izhorskaya 13/19, Moscow 127412, Russia

G. Röpke

  • FB Physik, University of Rostock, Universitätsplatz 3, D-18051 Rostock, Germany

  • *Fax +49 (0)381-498 2857. Email address: heidi@physics.uwa.edu.au

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Vol. 68, Iss. 3 — September 2003

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