We investigate the characteristic relations of type-II and -III intermittencies in the presence of noise. The theoretically predicted characteristic relation is that $〈\mathcal{l}〉\sim \exp \{|\epsilon {|}^2\}$ for a negative regime of ε and $〈\mathcal{l}〉\sim {\epsilon }^{-\nu }$ for the positive regime of ε $(1/2\mathrm{}<~\nu <1),$ where $〈\mathcal{l}〉$ is the average laminar length and $(1+\epsilon )$ is the slope of the local Poincaré map around the tangent point. We experimentally confirm these relations in a simple electronic circuit.

• Received 21 March 2003

DOI:https://doi.org/10.1103/PhysRevE.68.036203