Half-Life Variations of I131 Samples

William H. Zoller, Philip K. Hopke, James L. Fasching, Edward S. Macias, and William B. Walters
Phys. Rev. C 3, 1699 – Published 1 April 1971
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Abstract

We have determined the half-life of I131 samples to be 7.969±0.014 day under conditions in which the radiations of 12.0-day Xe131m are not detected, and to be 8.117±0.012 day under conditions in which the radiations of Xe131m are detected. Furthermore, we have seen no variations of half-life due to the physical state of the source to within 0.3%. We believe that these data indicate the half-life variations for I131 reported by Bergamini et al. and Kemeny may be accounted for by the escape of daughter Xe131m and/or absorbtion of the radiations of Xe131m.

  • Received 14 December 1970

DOI:https://doi.org/10.1103/PhysRevC.3.1699

©1971 American Physical Society

Authors & Affiliations

William H. Zoller

  • Department of Chemistry, University of Maryland, College Park, Maryland 20742

Philip K. Hopke

  • Department of Chemistry, State University College, Fredonia, New York 14603

James L. Fasching

  • Department of Chemistry, University of Rhode Island, Kingston, Rhode Island 02881

Edward S. Macias

  • Department of Chemistry, Washington University, St. Louis, Missouri 63130

William B. Walters*,†

  • A. A. Noyes Nuclear Chemistry Center, Massachusetts Institute of Technology, Cambridge, Massachusetts

  • *Present address: Department of Chemistry, University of Maryland, College Park, Maryland 20742.
  • Work supported in part by the U. S. Atomic Energy Commission under Contract No. AT(30-1)-905.

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Vol. 3, Iss. 4 — April 1971

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