Magnetic properties of epitaxial CoO/Fe(001) bilayers: The onset of exchange bias as a function of sublayer thickness and temperature

Jacek Gurgul, Ewa Młyńczak, Anna Kozioł-Rachwał, Krzysztof Matlak, Kinga Freindl, Ewa Madej, Nika Spiridis, Tomasz Ślęzak, and Józef Korecki
Phys. Rev. B 96, 104421 – Published 18 September 2017

Abstract

We study the magnetic properties of epitaxial double-wedge CoO/Fe bilayers grown on MgO(001). We present a comprehensive set of data derived from the hysteresis loops measured as a function of temperature in a wide range of CoO and Fe thicknesses using Kerr microscopy imaging. We focus on relatively high temperatures and CoO layers with small thicknesses to address the onset of the exchange bias. We identify a characteristic CoO thickness of 30–40 Å, above which the films can be considered bulklike. However, a considerable exchange bias is still observed even for CoO films as thin as 12 Å if the temperature is sufficiently low. From the results of the x-ray photoelectron spectroscopy measurements, we deduce the presence of an interfacial iron oxide layer of mixed stoichiometry and a uniform composition of the CoO layer along the CoO wedge.

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  • Received 8 July 2016
  • Revised 30 May 2017

DOI:https://doi.org/10.1103/PhysRevB.96.104421

©2017 American Physical Society

Physics Subject Headings (PhySH)

  1. Research Areas
Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Jacek Gurgul1,*, Ewa Młyńczak2,3,†, Anna Kozioł-Rachwał2,4,‡, Krzysztof Matlak2,§, Kinga Freindl1,∥, Ewa Madej1,¶, Nika Spiridis1,**, Tomasz Ślęzak2,††, and Józef Korecki1,2,‡‡

  • 1Jerzy Haber Institute of Catalysis and Surface Chemistry, Polish Academy of Sciences, Niezapominajek 8, 30-239 Krakow, Poland
  • 2Faculty of Physics and Applied Computer Science, AGH University of Science and Technology, Aleja Mickiewicza 30, 30-059 Krakow, Poland
  • 3Peter Grünberg Institut PGI-6, Forschungszentrum Jülich, 52425 Jülich, Germany
  • 4Spintronics Research Center, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8568, Japan

  • *Corresponding author: ncgurgul@cyf-kr.edu.pl
  • mlynczak@agh.edu.pl
  • akoziol@agh.edu.pl
  • §kmatlak@agh.edu.pl
  • ncfreind@cyf-kr.edu.pl
  • nczackie@cyf-kr.edu.pl
  • **ncspirid@cyf-kr.edu.pl
  • ††slezak@agh.edu.pl
  • ‡‡korecki@agh.edu.pl

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Issue

Vol. 96, Iss. 10 — 1 September 2017

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