Abstract
Hexagonal tin diselenide , a two-dimensional (2D) layered metal dichalcogenide from the IVA and VIA groups, has recently drawn numerous attention in 2D nano-optoelectronics. In this paper, we investigate characteristic lattice dynamics of mechanically exfoliated mono- and few-layer samples by Raman spectroscopy. Bulk has all four Raman active modes of low-frequency shear and layer-breathing modes, and high-frequency intralayer vibrational and modes observed around 18.9, 33.6, 107.9, and , respectively. From polarized Raman measurements, we find that mode intensity is independent of polarization configuration and increases linearly with layer number, which provides an effective approach to determine sample thickness. From low-temperature Raman measurements, and mode temperature coefficients of one-layer, three-layer, and bulk are around and , whereas they have almost zero values for low-frequency and modes of bulk due to different thermal responses of intralayer and interlayer vibrations. Using multiple excitation laser lines of 488, 514.5, 568, 647, and 785 nm, and mode intensities of bulk have a similar trend with weak maxima around 2.41 eV. Our work provides valuable information about lattice vibrations for further fundamental research and potential applications in 2D devices such as thermoelectric and infrared light detectors.
- Received 21 January 2017
DOI:https://doi.org/10.1103/PhysRevB.96.035401
©2017 American Physical Society