Pseudogap-related charge dynamics in the layered nickelate R2xSrxNiO4 (x1)

M. Uchida, Y. Yamasaki, Y. Kaneko, K. Ishizaka, J. Okamoto, H. Nakao, Y. Murakami, and Y. Tokura
Phys. Rev. B 86, 165126 – Published 19 October 2012

Abstract

Charge dynamics and its critical behavior are investigated near the metal-insulator transition of layered-nickelate R2xSrxNiO4 (R=Nd, Eu). The polarized x-ray absorption spectroscopy experiment clearly shows the multiorbital nature which enables the x2y2-orbital-based checkerboard-type charge ordering or correlation to persist up to the critical doping region (x1). In the barely metallic region proximate to the charge-ordered insulating phase, the nominal carrier density estimated from the Hall coefficient markedly decreases in accord with development of the pseudogap structure in the optical conductivity spectrum, while the effective mass is least enhanced. The present findings combined with the results of recent angle-resolved photoemission spectroscopy show that the pseudogap in the metal-insulator critical state evolves due to the checkerboard-type charge correlation to extinguish the coherent-motion carriers in a characteristic momentum (k)-dependent manner with lowering temperature.

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  • Received 20 January 2012

DOI:https://doi.org/10.1103/PhysRevB.86.165126

©2012 American Physical Society

Authors & Affiliations

M. Uchida1, Y. Yamasaki2, Y. Kaneko3, K. Ishizaka1, J. Okamoto2, H. Nakao2,4, Y. Murakami2, and Y. Tokura1,3,5

  • 1Department of Applied Physics, University of Tokyo, Tokyo 113-8656, Japan
  • 2Photon Factory and Condensed Matter Research Center, Institute of Materials Structure Science, High Energy Accelerator Research Organization, Tsukuba, Ibaraki 305-0801, Japan
  • 3Multiferroics Project, ERATO, Japan Science and Technology Agency (JST), Tokyo 113-8656, Japan
  • 4CREST, Japan Science and Technology Agency (JST), Tokyo 102-0076, Japan
  • 5Cross-Correlated Materials Research Group (CMRG) and Correlated Electron Research Group (CERG), RIKEN Advanced Science Institute (ASI), Wako 351-0198, Japan

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Issue

Vol. 86, Iss. 16 — 15 October 2012

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