• Editors' Suggestion

Terahertz Kerr and reflectivity measurements on the topological insulator Bi2Se3

G. S. Jenkins, A. B. Sushkov, D. C. Schmadel, N. P. Butch, P. Syers, J. Paglione, and H. D. Drew
Phys. Rev. B 82, 125120 – Published 22 September 2010

Abstract

We report the first terahertz Kerr measurements on bulk crystals of the topological insulator Bi2Se3. At T=10K and fields up to 8 T, the real and imaginary Kerr angle and reflectance measurements utilizing both linearly and circularly polarized incident radiation were measured at a frequency of 5.24 meV. A single fluid free carrier bulk response cannot describe the line shape. Data from one sample is quantitatively described by a surface state with a small mass and surprisingly large associated spectral weight. However, an alternative interpretation in terms of bulk carrier-density variations remains a possibility

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Received 31 July 2010

DOI:https://doi.org/10.1103/PhysRevB.82.125120

©2010 American Physical Society

Authors & Affiliations

G. S. Jenkins, A. B. Sushkov, D. C. Schmadel, N. P. Butch, P. Syers, J. Paglione, and H. D. Drew

  • Center for Nanophysics and Advanced Materials, Department of Physics, University of Maryland, College Park, Maryland 20742, USA

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 82, Iss. 12 — 15 September 2010

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×